Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy.
This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging.
This publication is a beneficial to students and individuals researching on optical and electron microscopy.
Auteur(s): Mulvey, T
Editeur: Elsevier Science
Année de Publication: 2017
pages: 198
Langue: Anglais
ISBN: 978-0-12-029911-9
eISBN: 978-1-4832-8224-4
ISSN: 0065-3012
Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy.
This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging.
This publication is a beneficial to students and individuals researching on optical and electron microscopy.
